Characterization Capabilities
- Surface Analysis Capabilities
- Bruker-Nano Dimension Icon Atomic Force Microscope (AFM) with both mechanical, electrical, and electrochemical capabilities,
- Bruker-Nano Contour GT-K Optical profiler with resolution down to 5nm.
- KLA-Tencor P7 surface step profiler for large area surface topography measurements with nanometer resolution over scans of several centimeter.
- Microstructures Imaging and Analysis
- Keyence VHX6000 with both low and high magnification tube lens systems and adjustable viewing angle.
- Zeiss optical microscope with large monitor HD video display and line measurement system.
- Sonoscan Gen6 Surface Acoustic Scanning Microscope.
- Chemical, Thermal Analysis and others
- Malvern Dynamic Laser Scattering system
- A DCAT-25 Tensiometer for dynamic contact angle measurements along with other measurements like Adhesion, Surface Tension etc.
- Gaertner ellipsometer
- Bruker Discover 8 XRD system
- Malvern Dynamic Laser Scattering system
- TA Instruments’ Differential Scanning Calorimeter and Thermo-Gravimetric Analyzer